In this study, wheat, Triticum aestivum L. (em Thell), genotypes containing the Dnx, Dn7, Dn6, and Dn4 genes for resistance to the Russian wheat aphid, Diuraphis noxia (Kurdjumov) (Hemiptera: Aphididae), along with Dn0, a susceptible control, were assessed to determine the categories of D. noxia biotype 2 (RWA2) resistance in each genotype and RWA2 feeding behaviors on Dnx and Dn0 plants by using the electronic penetration graph technique. At 14 d postinfestation, Dn0 plants exhibited intense chlorosis and leaf rolling, and all test genotypes expressed some degree of chlorosis and leaf rolling, except Dn7, which was not damaged. Both Dn7 and Dnx expressed antibiosis effects, significantly reducing the numbers of aphids on plants and the intrinsic rate of aphid increase. Dn6 plants seemed to contain tolerance, exhibiting tolerance index measurements for leaf and root dry weight and plant height that were significantly lower than those of the susceptible Dn0 plants. Principal component analyses indicated that antibiosis and leaf rolling data explained 80% of the variance among genotypes. Electronic penetration graph analysis demonstrated contrasting results between RWA1 and RWA2 phloem sieve element phase feeding events, but results indicated that Dnx resistance factors are present in the sieve element cells or phloem sap. Plants containing Dnx exhibit antibiosis resistance to D. noxia RWA2 similar to that in plants containing the Secale cereale L. (rye)-based Dn7 gene without the negative baking quality traits associated with Dn7.