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1 April 2001 Modeling the Dynamics of Adaptation to Transgenic Corn by Western Corn Rootworm (Coleoptera: Chrysomelidae)
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Abstract

A simulation model of the population dynamics and genetics of the western corn rootworm, Diabrotica virgifera virgifera LeConte, was created for a landscape of corn, soybean, and other crops. Although the model was created to study a 2-locus problem for beetles having genes for resistance to both crop rotation and transgenic corn, during this first phase of the project, the model was simulated to evaluate only resistance management plans for transgenic corn. Allele expression in the rootworm and toxin dose in the corn plant were the two most important factors affecting resistance development. A dominant resistance allele allowed quick evolution of resistance to transgenic corn, whereas a recessive allele delayed resistance >99 yr. With high dosages of toxin and additive expression, the time required to reach 3% resistance allele frequency ranged from 13 to >99 yr. With additive expression, lower dosages permitted the resistant allele frequency to reach 3% in 2–9 yr with refuges occupying 5–30% of the land. The results were sensitive to delays in emergence by susceptible adults and configuration of the refuge (row strips versus blocks).

David W. Onstad, Charles A. Guse, Joseph L. Spencer, Eli Levine, and Michael E. Gray "Modeling the Dynamics of Adaptation to Transgenic Corn by Western Corn Rootworm (Coleoptera: Chrysomelidae)," Journal of Economic Entomology 94(2), 529-540, (1 April 2001). https://doi.org/10.1603/0022-0493-94.2.529
Received: 27 April 2000; Accepted: 1 October 2000; Published: 1 April 2001
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