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24 July 2015 X-Band Rapid-Scan Electron Paramagnetic Resonance of Radiation-Induced Defects in Tooth Enamel
Zhelin Yu, Alexander Romanyukha, Sandra S. Eaton, Gareth R. Eaton
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Abstract

X-band rapid-scan electron paramagnetic resonance (EPR) spectra from tooth enamel samples irradiated with doses of 0.5, 1 and 10 Gy had substantially improved signal-to-noise relative to conventional continuous wave EPR. The radiation-induced signal in a 60 mg of a tooth enamel sample irradiated with a 0.5 Gy dose was readily characterized in spectra recorded with 34 min data acquisition times. The coefficient of variance of the calculated dose for a 1 Gy irradiated sample, based on simulation of the first-derivative spectra for three replicates as the sum of native and radiation-induced signals, was 3.9% for continuous wave and 0.4% for rapid scan.

Zhelin Yu, Alexander Romanyukha, Sandra S. Eaton, and Gareth R. Eaton "X-Band Rapid-Scan Electron Paramagnetic Resonance of Radiation-Induced Defects in Tooth Enamel," Radiation Research 184(2), 175-179, (24 July 2015). https://doi.org/10.1667/RR14032.1.1
Received: 28 January 2015; Accepted: 1 May 2015; Published: 24 July 2015
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